Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM

MLA

Tamanna, Nusrat, et al. “Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM.” ECS Solid State Letters, vol. 3, no. 10, Jan. 2014, pp. P117–19. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edo&AN=ejs52636948&authtype=sso&custid=ns315887.

APA

Tamanna, N., Haque, S., Prakash, A., Lee, D., Woo, J., Cha, E., Attarimashalkoubeh, B., Song, J., Lee, S., Moon, K., & Hwang, H. (2014). Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM. ECS Solid State Letters, 3(10), P117–P119.

Chicago

Tamanna, Nusrat, Saiful Haque, Amit Prakash, Daeseok Lee, Jiyong Woo, Euijun Cha, Behnoush Attarimashalkoubeh, et al. 2014. “Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM.” ECS Solid State Letters 3 (10): P117–19. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edo&AN=ejs52636948&authtype=sso&custid=ns315887.