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3D modeling of EUV photoresist using the multivariate Poisson propagation model

Authors :
Felix, Nelson M.
Lio, Anna
Long, Luke
Neureuther, Andrew R.
Naulleau, Patrick P.
Source :
Proceedings of SPIE; February 2021, Vol. 11609 Issue: 1 p116091C-116091C-12, 11493022p
Publication Year :
2021

Details

Language :
English
ISSN :
0277786X
Volume :
11609
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs56046166
Full Text :
https://doi.org/10.1117/12.2589532