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Structured illumination microscopy with direct wavefront sensing

Authors :
Bifano, Thomas G.
Gigan, Sylvain
Ji, Na
Lin, Ruizhe
Kner, Peter A.
Source :
Proceedings of SPIE; March 2021, Vol. 11652 Issue: 1 p116520A-116520A-4, 1048685p
Publication Year :
2021

Details

Language :
English
ISSN :
0277786X
Volume :
11652
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs56592678
Full Text :
https://doi.org/10.1117/12.2582806