A physics-based electromigration reliability model for interconnects lifetime prediction

Details

Language :

English

ISSN :

1674733X and 18691919

Volume :

64

Issue :

11

Database :

Supplemental Index

Journal :

SCIENCE CHINA Information Sciences

Publication Type :

Periodical

Accession number :

ejs58072692

Full Text :

https://doi.org/10.1007/s11432-020-3140-4