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A Bayesian Semiparametric Accelerated Failure Time Model

Authors :
Walker, Stephen
Mallick, Bani K.
Source :
Biometrics; June 1999, Vol. 55 Issue: 2 p477-483, 7p
Publication Year :
1999

Abstract

Summary. A Bayesian semiparametric approach is described for an accelerated failure time model. The error distribution is assigned a Polya tree prior and the regression parameters a noninformative hierarchical prior. Two cases are considered: the first assumes error terms are exchangeable; the second assumes that error terms are partially exchangeable. A Markov chain Monte Carlo algorithm is described to obtain a predictive distribution for a future observation given both uncensored and censored data.

Details

Language :
English
ISSN :
0006341X and 15410420
Volume :
55
Issue :
2
Database :
Supplemental Index
Journal :
Biometrics
Publication Type :
Periodical
Accession number :
ejs6020592
Full Text :
https://doi.org/10.1111/j.0006-341X.1999.00477.x