Back to Search
Start Over
A Bayesian Semiparametric Accelerated Failure Time Model
- Source :
- Biometrics; June 1999, Vol. 55 Issue: 2 p477-483, 7p
- Publication Year :
- 1999
-
Abstract
- Summary. A Bayesian semiparametric approach is described for an accelerated failure time model. The error distribution is assigned a Polya tree prior and the regression parameters a noninformative hierarchical prior. Two cases are considered: the first assumes error terms are exchangeable; the second assumes that error terms are partially exchangeable. A Markov chain Monte Carlo algorithm is described to obtain a predictive distribution for a future observation given both uncensored and censored data.
Details
- Language :
- English
- ISSN :
- 0006341X and 15410420
- Volume :
- 55
- Issue :
- 2
- Database :
- Supplemental Index
- Journal :
- Biometrics
- Publication Type :
- Periodical
- Accession number :
- ejs6020592
- Full Text :
- https://doi.org/10.1111/j.0006-341X.1999.00477.x