Developing a new generation of integrated micro-spec far-infrared spectrometers for the experiment for cryogenic large-aperture intensity mapping (EXCLAIM)

Details

Language :

English

ISSN :

0277786X

Volume :

12180

Issue :

1

Database :

Supplemental Index

Journal :

Proceedings of SPIE

Publication Type :

Periodical

Accession number :

ejs60792204

Full Text :

https://doi.org/10.1117/12.2629502