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Polymer Thin-Film Transistors with Chemically Modified Dielectric Interfaces by Atmospheric-Pressure Plasma Technology

Authors :
Kow-Ming, Chang
Chih-Hsiang, Lin
Shi-Xuan, Huang
Source :
ECS Transactions; April 2008, Vol. 11 Issue: 25
Publication Year :
2008

Abstract

Poly-3-hexylthiophene (P3HT) is coated on a chemically modified SiO2 gate dielectric layer as an active layer to fabricate organic thin-film transistors (OTFTs). This study uses a new atmospheric-pressure plasma (APP) approach to treat SiO2 surfaces, and investigates its effect on the electric characteristics of OTFTs. The APP process can be performed at low temperature (<100ºC) and atmospheric pressure, so it is very suitable for use on a plastic substrate. After the SiO2 surface has been modified by the APP process with hexamethyldisilazane (HMDS), it exhibits typical I-V characteristics of TFTs. Calculations reveal that its field effect mobility can reach 0.02-0.03 cm2/Vs, which is about 15 times higher than that before the modification, and the threshold voltage is below -10V. The performance is even better than that obtained following the usual surface treatment of the SiO2 surface by spin-coating or evaporation.

Details

Language :
English
ISSN :
19385862 and 19386737
Volume :
11
Issue :
25
Database :
Supplemental Index
Journal :
ECS Transactions
Publication Type :
Periodical
Accession number :
ejs61746222
Full Text :
https://doi.org/10.1149/1.2930792