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The measurement of internal defect in the half-grouted sleeves by low frequency ultrasonics

Authors :
Shull, Peter J.
Gyekenyesi, Andrew L.
Wu, H. Felix
Yu, Tzuyang
Zhang, Lu
Tang, Yongze
Zeng, Jiajun
Liu, Qizhou
Li, Hongyu
Source :
Proceedings of SPIE; May 2023, Vol. 12487 Issue: 1 p124870A-124870A-9, 1123840p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12487
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63020481
Full Text :
https://doi.org/10.1117/12.2657625