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Novel assist layers to enhance EUV lithography performance of photoresists on different substrates

Authors :
Guerrero, Douglas
Amblard, Gilles R.
Li, Si
Lowes, Joyce
Zhang, Ruimeng
Luo, Ming
Brakensiek, Kelsey
Driessche, Veerle Van
Guerrero, Douglas J.
Source :
Proceedings of SPIE; May 2023, Vol. 12498 Issue: 1 p124980N-124980N-11, 12373032p
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12498
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs63131837
Full Text :
https://doi.org/10.1117/12.2658529