Incorporating Component-Level Testing Into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities

Device-level failure probabilities derived from historical, similar radiation datasets can be inputted into a system-level radiation reliability model to provide insight into that system’s failure probability. A linear voltage regulator reliability model that utilizes historical total ionizing dose (TID) [< 100 krad(SiO2)] and displacement damage dose (DDD) measurements (<inline-formula> <tex-math notation="LaTeX">$ &lt; 9\times 10^{11}$ </tex-math></inline-formula> equivalent 1-MeV neutrons/cm2) is used as a demonstration system. This methodology aims to reduce engineering uncertainty at early design stages before radiation test data are available or on quick turn-around projects without radiation test budgets.