Back to Search Start Over

Advancements in EUV photoresists for high-NA lithography

Authors :
Naulleau, Patrick P.
Gargini, Paolo A.
Itani, Toshiro
Ronse, Kurt G.
Develioglu, Aysegul
Vockenhuber, Michaela
van Lent-Protasova, Lidia
Mochi, Iacopo
Ekinci, Yasin
Kazazis, Dimitrios
Source :
Proceedings of SPIE; November 2023, Vol. 12750 Issue: 1 p1275008-1275008-10
Publication Year :
2023

Details

Language :
English
ISSN :
0277786X
Volume :
12750
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs64715794
Full Text :
https://doi.org/10.1117/12.2686250