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A Multistage Deep Learning Network for Trace Explosive Residues Detection in SERS Chips
- Source :
- IEEE Sensors Journal; December 2023, Vol. 23 Issue: 24 p31493-31505, 13p
- Publication Year :
- 2023
-
Abstract
- To address the challenges of relying on specialized personnel and incurring significant time costs in qualitative and quantitative analysis using surface-enhanced Raman scattering (SERS) technology for explosive residue detection, this article proposes a detection method for explosive residues based on a multistage deep learning network and SERS chip. To improve the qualitative analysis performance of the SERS spectrum, a novel fusion attention module-based residual neural (FAB-ResNet) is constructed through the integration of a modified attention mechanism into the ResNet network. In addition, for proper processing of long sequential data, the nested long short-term memory (NLSTM) network is selected for quantitative analysis with its powerful global information aggregating capability. Consequently, the NLSTM is incorporated into FAB-ResNet to construct a multistage hybrid network. Extensive experiments are carried out to prove the effectiveness of the proposed hybrid network. The qualitative results demonstrated the superiority of the proposed FAB-ResNet with its outstanding classification accuracy (100%). Meanwhile, by comparing quantitative results, the NLSTM network provides promising performance (<inline-formula> <tex-math notation="LaTeX">${R} ^{{2}}$ </tex-math></inline-formula> = 0.9835, root mean square error (RMSE) = 0.1653, mean absolute error (MAE) = 0.0916, and mean absolute relative error (MARE) = 2.7488%). Furthermore, the comparative results among other state-of-the-art networks confirmed the effectiveness of the proposed method as a means of explosive residue detection and analysis, which shows the potential for further application of SERS technology in explosive site detection.
Details
- Language :
- English
- ISSN :
- 1530437X and 15581748
- Volume :
- 23
- Issue :
- 24
- Database :
- Supplemental Index
- Journal :
- IEEE Sensors Journal
- Publication Type :
- Periodical
- Accession number :
- ejs64994427
- Full Text :
- https://doi.org/10.1109/JSEN.2023.3330509