Back to Search Start Over

A Multistage Deep Learning Network for Trace Explosive Residues Detection in SERS Chips

Authors :
Zhang, Feng
Yang, Jianchun
Zhang, Xinyu
Su, Shuaiwu
Luo, Jiayang
Li, Jiahao
Li, Xueming
Source :
IEEE Sensors Journal; December 2023, Vol. 23 Issue: 24 p31493-31505, 13p
Publication Year :
2023

Abstract

To address the challenges of relying on specialized personnel and incurring significant time costs in qualitative and quantitative analysis using surface-enhanced Raman scattering (SERS) technology for explosive residue detection, this article proposes a detection method for explosive residues based on a multistage deep learning network and SERS chip. To improve the qualitative analysis performance of the SERS spectrum, a novel fusion attention module-based residual neural (FAB-ResNet) is constructed through the integration of a modified attention mechanism into the ResNet network. In addition, for proper processing of long sequential data, the nested long short-term memory (NLSTM) network is selected for quantitative analysis with its powerful global information aggregating capability. Consequently, the NLSTM is incorporated into FAB-ResNet to construct a multistage hybrid network. Extensive experiments are carried out to prove the effectiveness of the proposed hybrid network. The qualitative results demonstrated the superiority of the proposed FAB-ResNet with its outstanding classification accuracy (100%). Meanwhile, by comparing quantitative results, the NLSTM network provides promising performance (<inline-formula> <tex-math notation="LaTeX">${R} ^{{2}}$ </tex-math></inline-formula> = 0.9835, root mean square error (RMSE) = 0.1653, mean absolute error (MAE) = 0.0916, and mean absolute relative error (MARE) = 2.7488%). Furthermore, the comparative results among other state-of-the-art networks confirmed the effectiveness of the proposed method as a means of explosive residue detection and analysis, which shows the potential for further application of SERS technology in explosive site detection.

Details

Language :
English
ISSN :
1530437X and 15581748
Volume :
23
Issue :
24
Database :
Supplemental Index
Journal :
IEEE Sensors Journal
Publication Type :
Periodical
Accession number :
ejs64994427
Full Text :
https://doi.org/10.1109/JSEN.2023.3330509