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Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors

Authors :
Mounir, Ahmed
Iniguez, Benjamin
Lime, Francois
Kloes, Alexander
Knobloch, Theresia
Grasser, Tibor
Source :
IEEE Transactions on Electron Devices; January 2024, Vol. 71 Issue: 1 p884-889, 6p
Publication Year :
2024

Abstract

A physics-based analytical dc compact model for single back-gated MoS2 field effect transistors (FETs) is presented. The model is developed by calculating the charge inside the 2-D layer which is expressed in terms of the Lambert W function that recently has become the standard in SPICE simulators. The current is then calculated in terms of the charge densities at the drain and source ends of the channel. A new mobility model is presented to account for the observed superlinear current increase above a certain gate voltage. Despite the simplicity of the model, it shows very good agreement with the experimental data as well as the possibility to be extended to model the double-gate MoS2 FETs.

Details

Language :
English
ISSN :
00189383 and 15579646
Volume :
71
Issue :
1
Database :
Supplemental Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Periodical
Accession number :
ejs65156317
Full Text :
https://doi.org/10.1109/TED.2023.3338585