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Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors
- Source :
- IEEE Transactions on Electron Devices; January 2024, Vol. 71 Issue: 1 p884-889, 6p
- Publication Year :
- 2024
-
Abstract
- A physics-based analytical dc compact model for single back-gated MoS2 field effect transistors (FETs) is presented. The model is developed by calculating the charge inside the 2-D layer which is expressed in terms of the Lambert W function that recently has become the standard in SPICE simulators. The current is then calculated in terms of the charge densities at the drain and source ends of the channel. A new mobility model is presented to account for the observed superlinear current increase above a certain gate voltage. Despite the simplicity of the model, it shows very good agreement with the experimental data as well as the possibility to be extended to model the double-gate MoS2 FETs.
Details
- Language :
- English
- ISSN :
- 00189383 and 15579646
- Volume :
- 71
- Issue :
- 1
- Database :
- Supplemental Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Periodical
- Accession number :
- ejs65156317
- Full Text :
- https://doi.org/10.1109/TED.2023.3338585