Cite
Graph-Based Compact Model (GCM) for Efficient Transistor Parameter Extraction: A Machine Learning Approach on 12 nm FinFETs
MLA
Yang, Ziyao, et al. “Graph-Based Compact Model (GCM) for Efficient Transistor Parameter Extraction: A Machine Learning Approach on 12 Nm FinFETs.” IEEE Transactions on Electron Devices, vol. 71, no. 1, Jan. 2024, pp. 254–62. EBSCOhost, https://doi.org/10.1109/TED.2023.3327973.
APA
Yang, Z., Gaidhane, A. D., Anderson, K., Workman, G., & Cao, Y. (2024). Graph-Based Compact Model (GCM) for Efficient Transistor Parameter Extraction: A Machine Learning Approach on 12 nm FinFETs. IEEE Transactions on Electron Devices, 71(1), 254–262. https://doi.org/10.1109/TED.2023.3327973
Chicago
Yang, Ziyao, Amol D. Gaidhane, Kassandra Anderson, Glenn Workman, and Yu Cao. 2024. “Graph-Based Compact Model (GCM) for Efficient Transistor Parameter Extraction: A Machine Learning Approach on 12 Nm FinFETs.” IEEE Transactions on Electron Devices 71 (1): 254–62. doi:10.1109/TED.2023.3327973.