Understanding metric-related pitfalls in image analysis validation

MLA

Reinke, Annika, et al. “Understanding Metric-Related Pitfalls in Image Analysis Validation.” Nature Methods, vol. 21, no. 2, Feb. 2024, pp. 182–94. EBSCOhost, https://doi.org/10.1038/s41592-023-02150-0.

APA

Reinke, A., Tizabi, M. D., Baumgartner, M., Eisenmann, M., Heckmann-Nötzel, D., Kavur, A. E., Rädsch, T., Sudre, C. H., Acion, L., Antonelli, M., Arbel, T., Bakas, S., Benis, A., Buettner, F., Cardoso, M. J., Cheplygina, V., Chen, J., Christodoulou, E., Cimini, B. A., … Maier-Hein, L. (2024). Understanding metric-related pitfalls in image analysis validation. Nature Methods, 21(2), 182–194. https://doi.org/10.1038/s41592-023-02150-0

Chicago

Reinke, Annika, Minu D. Tizabi, Michael Baumgartner, Matthias Eisenmann, Doreen Heckmann-Nötzel, A. Emre Kavur, Tim Rädsch, et al. 2024. “Understanding Metric-Related Pitfalls in Image Analysis Validation.” Nature Methods 21 (2): 182–94. doi:10.1038/s41592-023-02150-0.