Back to Search Start Over

X-ray optics development and metrology at Shanghai synchrotron radiation facility

Details

Language :
English
ISSN :
0277786X
Volume :
13069
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs65490871
Full Text :
https://doi.org/10.1117/12.3023334