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Impact of stress current on electro-optical properties of the active cavity region in 850 nm VCSELs

Authors :
Lei, Chun
Choquette, Kent D.
Jaeger, A.
Ledentsov, N.
Meinert, H.
Stock, M.
Ehling, K.
Titkov, I. E.
Makarov, O. Yu.
Ledentsov, N. N.
Source :
Proceedings of SPIE; March 2024, Vol. 12904 Issue: 1 p129040F-129040F-12, 12774973p
Publication Year :
2024

Details

Language :
English
ISSN :
0277786X
Volume :
12904
Issue :
1
Database :
Supplemental Index
Journal :
Proceedings of SPIE
Publication Type :
Periodical
Accession number :
ejs65990297
Full Text :
https://doi.org/10.1117/12.3001840