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A Snapback-Free and Low-Loss RC-LIGBT With Integrated Double Self-Biased nMOS

Authors :
Chen, Weizhong
Li, Cheng
Shen, Wenliang
Zhang, Hongsheng
Huang, Yi
Han, Zhengsheng
Source :
IEEE Transactions on Electron Devices; 2024, Vol. 71 Issue: 6 p3831-3837, 7p
Publication Year :
2024

Abstract

A snapback-free and low turn-off loss reverse-conducting lateral insulated gate bipolar transistor (RC-LIGBT) with integrated double self-biased n-channel MOS, named DSM is demonstrated by the TCAD SENTAURUS. The DSM including extraction charge nMOS (EC-MOS) and reverse conduction nMOS (RC-MOS) are both located at the collector side. The gates of the EC-MOS and RC-MOS are shortly connected with the N+ collector and N-base, respectively. Consequently, the double auxiliary gates automatically turn on functions without an extra control signal. First, at the forward conduction, the EC-MOS is automatically turned on with a saturated state while the RC-MOS is turned off. Moreover, the P-base substrate of the DSM acts as the electron barrier, which can avoid the short effect of the N+ Collector, thus the snapback is eliminated. Second, at the reverse conduction, the EC-MOS is turned off and the RC-MOS is triggered automatically with a saturate state, then the reverse conduction capability is realized. Third, at the turn-off process, the RC-MOS is turned off, and the EC-MOS is automatically turned on again to extract excessive carriers with the increased bus voltage <inline-formula> <tex-math notation="LaTeX">${V}_{\text {CE}}$ </tex-math></inline-formula>, thus the turn-off energy loss (<inline-formula> <tex-math notation="LaTeX">${E}_{\text {OFF}}\text {)}$ </tex-math></inline-formula> is effectively reduced. As a result, the DSM-LIGBT achieves a snapback-free and superior trade-off relationship between <inline-formula> <tex-math notation="LaTeX">${V}_{ \text {ON}}$ </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">${E}_{ \text {OFF}}$ </tex-math></inline-formula>.

Details

Language :
English
ISSN :
00189383 and 15579646
Volume :
71
Issue :
6
Database :
Supplemental Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Periodical
Accession number :
ejs66505319
Full Text :
https://doi.org/10.1109/TED.2024.3394454