Editorial Expression of Concern: Generation of TRAIL-resistant cell line models reveals distinct adaptive mechanisms for acquired resistance and re-sensitization

Details

Language :

English

ISSN :

09509232 and 14765594

Issue :

Preprints

Database :

Supplemental Index

Journal :

Oncogene

Publication Type :

Periodical

Accession number :

ejs66975068

Full Text :

https://doi.org/10.1038/s41388-024-03110-4