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Electrical and Thermal Characteristics Optimization in Interposer-Based 2.5-D Integrated Circuits

Authors :
Zhi, Changle
Dong, Gang
Yang, Deguang
Liu, Daihang
Feng, Yinghao
Wang, Yang
Zhu, Zhangming
Source :
IEEE Transactions on Very Large Scale Integration Systems; 2025, Vol. 33 Issue: 3 p627-637, 11p
Publication Year :
2025

Abstract

In this work, a comprehensive analysis and optimization method of electrical and thermal characteristics in 2.5-D integrated circuits (ICs) is performed, including rapid heat distribution modeling, integrated voltage regulator (IVR) chip modeling, and power delivery network (PDN) modeling. Based on the proposed method, chiplet placement, decoupling placement, and IVR parameter settings that compromise the total PDN impedance, IVR impedance, and thermal distribution characteristics can be obtained. First, a rapid thermal analysis method for multiple heat sources is proposed by integrating the equivalent thermal resistance method and commercial tools. The thermal method significantly improves the computational efficiency and reduces the memory usage. Then, we analyze the electrical characteristics of a typical low dropout (LDO) and model the complete 2.5-D PDN, including interposers, chiplets, IVRs, through-silicon vias (TSVs), bumps, decoupling capacitors, and other components. The electrical and thermal problems in the 2.5-D system are formulated and a Metropolis rule-based algorithm is used to derive optimal solutions. Finally, the optimal placement schemes and parameter settings are iterated under different constraints. This method allows for the adjustment of target impedance, noise current, thermal limit, and other constraints based on varying practical situations. In the time-domain analysis, it can be found that the capacitance value is reduced while maintaining the power supply performance. With high accuracy in thermal and electrical modeling, this work provides an in-depth reference for the co-design of chiplet-based 2.5-D ICs.

Details

Language :
English
ISSN :
10638210 and 15579999
Volume :
33
Issue :
3
Database :
Supplemental Index
Journal :
IEEE Transactions on Very Large Scale Integration Systems
Publication Type :
Periodical
Accession number :
ejs69155890
Full Text :
https://doi.org/10.1109/TVLSI.2024.3478846