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FDTD Modeling of Void Defects in VLSI Interconnection

Authors :
Alimenti F
Impronta M
Palazzari V
Placidi P
Stopponi G
Scorzoni A
Roselli L
Source :
XXVII General Assembly of URSI, Maastricht (NE), 2002, info:cnr-pdr/source/autori:Alimenti F, Impronta M, Palazzari V, Placidi P, Stopponi G, Scorzoni A, Roselli L/congresso_nome:XXVII General Assembly of URSI/congresso_luogo:Maastricht (NE)/congresso_data:2002/anno:2002/pagina_da:/pagina_a:/intervallo_pagine
Publication Year :
2002

Subjects

Subjects :
FDTD
simulation
electromigration

Details

Database :
OpenAIRE
Journal :
XXVII General Assembly of URSI, Maastricht (NE), 2002, info:cnr-pdr/source/autori:Alimenti F, Impronta M, Palazzari V, Placidi P, Stopponi G, Scorzoni A, Roselli L/congresso_nome:XXVII General Assembly of URSI/congresso_luogo:Maastricht (NE)/congresso_data:2002/anno:2002/pagina_da:/pagina_a:/intervallo_pagine
Accession number :
edsair.cnr...........9fcd4589ee009d949be0d9b48e3e5e6b

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Authors Abstract Subjects Details