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Taking Bragg Coherent Diffraction Imaging to Higher Energies at Fourth Generation Synchrotrons: Nanoscale Characterization

Authors :
Richard, Marie-Ingrid
Martens, Isaac
Dupraz, Maxime
Drnec, Jakub
Honkimäki, Veijo
Chatelier, Corentin
Atlan, Clément
Mirolo, Marta
Levi, Mor
Rabkin, Eugen
Eymery, Joël
Naidu, Akshata
Schülli, Tobias
Leake, Steven
Nanostructures et Rayons X (NRX)
Modélisation et Exploration des Matériaux (MEM)
Institut de Recherche Interdisciplinaire de Grenoble (IRIG)
Direction de Recherche Fondamentale (CEA) (DRF (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA))
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA)-Institut de Recherche Interdisciplinaire de Grenoble (IRIG)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes (UGA)
European Synchroton Radiation Facility [Grenoble] (ESRF)
European Synchrotron Radiation Facility (ESRF)
Technion - Israel Institute of Technology [Haifa]
Nanostructures et Rayonnement Synchrotron (NRS )
European Synchrotron Research Facility
European Project: 818823,CARINE
Source :
ACS Applied Nano Materials, ACS Applied Nano Materials, In press, 6 (12), pp.10246-10255. ⟨10.1021/acsanm.3c01145⟩
Publication Year :
2023
Publisher :
HAL CCSD, 2023.

Abstract

International audience; High-energy Bragg coherent diffraction imaging (BCDI) can enable three-dimensional imaging of atomic structure within individual crystallites in complex environments. Here, we show that sufficient coherent photon flux is available to extend the BCDI technique to higher energies to: 1) obtain improved strain information and sensitivity 1 at the nanoscale with higher order Bragg reflections, 2) exploit BCDI in embedded materials or complex operando environments, 3) reduce x-ray induced sample modification and 4) minimize dynamical scattering effects. We demonstrate the nanoscale imaging technique on the same sub-micron sized crystal at 8.5, 19.9 and 33.4 keV by taking advantage of the brilliance and coherence of the fourth generation Extremely Brilliant Source of the ID01 beamline at ESRF-The European Synchrotron (Grenoble, France). The photon flux, data quality, resolution and strain information are compared. We also show first coherent diffraction measurements performed at the ID31-EBS beamline at an energy of 41 keV.

Details

Language :
English
ISSN :
25740970
Database :
OpenAIRE
Journal :
ACS Applied Nano Materials, ACS Applied Nano Materials, In press, 6 (12), pp.10246-10255. ⟨10.1021/acsanm.3c01145⟩
Accession number :
edsair.dedup.wf.001..192b5e2411250f0f0ef26a6805733673
Full Text :
https://doi.org/10.1021/acsanm.3c01145⟩