Comparison of test images obtained from various SNOM configurations

Authors :: Bainier, C.
Vannier, C.
Courjon, D.
Rivoal, C.-J.
Ducourtrieux, S.
De Wilde, Y.
Aigouy, L.
Formanek, F.
Belliard, L.
Siry, P.
Perrin, Bernard
Laboratoire des Milieux Désordonnés et Hétérogènes (LMDH)
Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)
Source :: Applied optics, Applied optics, Optical Society of America, 2003, 42, pp.691, Applied optics, 2003, 42, pp.691
Publication Year :: 2003
Publisher :: HAL CCSD, 2003.
Abstract: The characteristics of a few experimental near-field optical microscopes, located in different laboratories, have been compared on the basis of their ability to image a well-defined submicrometer test object.

Subjects :: genetic structures
Optical testing
Scanning microscopy
Micro-optics
Image analysis

Language :: English
ISSN :: 00036935, 15394522, 1559128X, and 21553165
Database :: OpenAIRE
Journal :: Applied optics, Applied optics, Optical Society of America, 2003, 42, pp.691, Applied optics, 2003, 42, pp.691
Accession number :: edsair.dedup.wf.001..1f4e52985af6d263728d9a739bce360f

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