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Experiment with Highly Charged Ions at the Paris ECR Ion Source, SIMPA
- Source :
- ECRIS 2008, 18th International Workshop on ECR Ion Sources, ECRIS 2008, 18th International Workshop on ECR Ion Sources, Sep 2008, Chicago, United States
- Publication Year :
- 2008
- Publisher :
- HAL CCSD, 2008.
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Abstract
- The full permanent magnet "supernanogan" type ECR (electron cyclotron resonance) ion source, SIMPA (Source d'Ions Multicharges de Paris) has been jointly operated by LKB (Laboratoire Kastler Brossel) and INSP (Institut des NanoSciences de Paris) since 2004. Since this time numerous projects have been started to use the extracted beam in atomic physics and surface physics experiments and the x-ray radiation of the ECR plasma for plasma and atomic physics investigations. In this paper recent achievements will be reported that include the first use of an electrostatic ion trap * for trapping highly charged ions on the beam line of an ECR ion source and electron temperature and density measurements with the help of the observation of the bremsstrahlung spectrum of the electrons in the ECR plasma of the source.** Also a new vacuum double crystal spectrometer *** is under construction in our lab that will allow us to measure the very narrow inner shell transitions of highly charged ions produced in the ECR plasma and provide new x-ray standards with this method for the atomic physics community.
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- ECRIS 2008, 18th International Workshop on ECR Ion Sources, ECRIS 2008, 18th International Workshop on ECR Ion Sources, Sep 2008, Chicago, United States
- Accession number :
- edsair.dedup.wf.001..25b570f558155533e068d0db2ae4915c