Analysis of superconducting thin films by ion beam methods. Comparison of nuclear techniques and SIMS

Authors :: Stoquert, J.P.
Fogarassy, E.
Stuck, R.
Guillaume, G.
Siffert, P.
Perriere, J.
Heyd, Yvette
Institut de Recherches Subatomiques (IReS)
Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Cancéropôle du Grand Est-Université Louis Pasteur - Strasbourg I-Centre National de la Recherche Scientifique (CNRS)
Source :: Surface and Interface Analysis, Surface and Interface Analysis, Wiley-Blackwell, 1990, 15, pp.57
Publication Year :: 1990
Publisher :: HAL CCSD, 1990.

Language :: English
ISSN :: 01422421 and 10969918
Database :: OpenAIRE
Journal :: Surface and Interface Analysis, Surface and Interface Analysis, Wiley-Blackwell, 1990, 15, pp.57
Accession number :: edsair.dedup.wf.001..369b3a4b195102bfc0f624588a2ab352

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