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Reliability study on technology trends beyond 20nm

Authors :
Amat, E.
Antonio Calomarde
Rubio, A.
Source :
Scopus-Elsevier

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier
Accession number :
edsair.dedup.wf.001..445cc48f71569c00e855edd5b2060146

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