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Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (Synchrotron SOLEIL)
Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (Synchrotron SOLEIL)
- Source :
- EMRS 2016, EMRS 2016, May 2016, Lille, France
- Publication Year :
- 2016
- Publisher :
- HAL CCSD, 2016.
-
Abstract
- International audience
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- EMRS 2016, EMRS 2016, May 2016, Lille, France
- Accession number :
- edsair.dedup.wf.001..4ad23713006b1914e460aa0e32ffae3b