Embedded Tutorial intitulé 'Power-Aware Testing and Test Strategies for Low Power Devices'

Authors :: Girard, Patrick
Nicolici, Nicola
Wen, Xiaoqing
Conception et Test de Systèmes MICroélectroniques (SysMIC)
Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)
Department of Electrical and Computer Engineering [Hamilton]
McMaster University [Hamilton, Ontario]
Kyushu Institute of Technology
Source :: ISQED'2012: International Symposium on Quality of Electronic Design, ISQED'2012: International Symposium on Quality of Electronic Design, Mar 2012, Santa Clara, United States
Publication Year :: 2012
Publisher :: HAL CCSD, 2012.
Abstract: International audience

Subjects :: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
ComputingMilieux_MISCELLANEOUS

Language :: English
Database :: OpenAIRE
Journal :: ISQED'2012: International Symposium on Quality of Electronic Design, ISQED'2012: International Symposium on Quality of Electronic Design, Mar 2012, Santa Clara, United States
Accession number :: edsair.dedup.wf.001..4af0aced3eee5292251059ceb08a77ed

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