Measurement and characterization of low frequency noise collector current in 0.13 µm SiGe:C HBTs

Authors :: Seif, M.
Pascal, F.
Sagnes, B.
Hoffmann, A.
Haendler, S.
Chevalier, P.
Gloria, D.
Institut d’Electronique et des Systèmes (IES)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
STMicroelectronics [Crolles] (ST-CROLLES)
Source :: 2015 International Conference on Noise and Fluctuations (ICNF), 2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China
Publication Year :: 2015
Publisher :: HAL CCSD, 2015.
Abstract: International audience

Subjects :: ComputingMilieux_MISCELLANEOUS
[SPI.TRON]Engineering Sciences [physics]/Electronics

Language :: English
Database :: OpenAIRE
Journal :: 2015 International Conference on Noise and Fluctuations (ICNF), 2015 International Conference on Noise and Fluctuations (ICNF), 2015, Xian, China
Accession number :: edsair.dedup.wf.001..54d961d2679483f0d6fc9084117e7bfc

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