Back to Search Start Over

Comparative investigation of high resolution transmission electron microscopy and Fourier transform infrared spectroscopy for GaN films on sapphire substrate

Authors :
Li, K.
Hou, Yt
Feng, Zc
Chua, Sj
Li, Mf
Lau, Ewp
Andrew Wee
Source :
Scopus-Elsevier, ResearcherID

Details

Database :
OpenAIRE
Journal :
Scopus-Elsevier, ResearcherID
Accession number :
edsair.dedup.wf.001..58594069cda6d83b27fb5ce14cc9d41f

Tools

Authors Abstract Subjects Details