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Characterization and modeling of low frequency noise in 0.13 µm BiCMOS SiGe: C heterojunction bipolar trasnsistors
- Publication Year :
- 2014
- Publisher :
- HAL CCSD, 2014.
-
Abstract
- International audience
Details
- Language :
- English
- Database :
- OpenAIRE
- Accession number :
- edsair.dedup.wf.001..6727f24e972ee842f74bfe9d53560568