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Planar Langmuir probe in pulsing regime

Details

Language :
English
Database :
OpenAIRE
Journal :
PESM (Plasma Etch and Strip for Microelectronics), PESM (Plasma Etch and Strip for Microelectronics), May 2011, Mechelen, Belgium
Accession number :
edsair.dedup.wf.001..689a25d0cda03debd4e3b86a6c44b50e