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Planar Langmuir probe in pulsing regime
- Source :
- PESM (Plasma Etch and Strip for Microelectronics), PESM (Plasma Etch and Strip for Microelectronics), May 2011, Mechelen, Belgium
- Publication Year :
- 2011
- Publisher :
- HAL CCSD, 2011.
-
Abstract
- International audience
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- PESM (Plasma Etch and Strip for Microelectronics), PESM (Plasma Etch and Strip for Microelectronics), May 2011, Mechelen, Belgium
- Accession number :
- edsair.dedup.wf.001..689a25d0cda03debd4e3b86a6c44b50e