Back to Search
Start Over
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2009)
- Source :
- EDA Publishing Association. EDA Publishing Association, pp.429, 2009, Proceedings
- Publication Year :
- 2009
- Publisher :
- HAL CCSD, 2009.
-
Abstract
- ISBN: 978-2-35500-009-6; This Symposium is a follow-up to the very successful issues held in 1999 and 2000 in Paris and in 2001, 2002 and 2003 in Mandelieu-La Napoule, in 2004 and 2005 in Montreux, Switzerland and in 2006 and in 2007 in Stresa, Italy and in 2008 in Nice, France. This series of Symposia is a unique single-meeting event expressly planned to bring together participants interested in manufacturing microstructures and participants interested in design tools to facilitate the conception of these microstructures. Again, a special emphasis will be put on the very crucial needs of MEMS/MOEMS in terms of packaging solutions. The goal of the Symposium is to provide a forum for in-depth investigations and interdisciplinary discussions involving design, modeling, testing, micromachining, microfabrication, integration and packaging of structures, devices, and systems. We hope you enjoy the technical presentations of 2 conferences - CAD, Design and Test / Microfabrication, Integration and Packaging -, of 2 joint invited talks, and of a special session on 3D Integration of MEMS.
- Subjects :
- Signal processing
Failure analysis
Physical measurements
Technology CAD in general
Dimensional measurements
Characterization
Structured design methodologies
Assembly technologies
Numerical simulation
actuators
Process integration between MEMS and electronics
Test structures
Interoperability of CAD/CAE tools
Integrated CAD tools
Failure mechanisms
Devices and components (sensors
micromolding)
Languages for interchange data among designs and tools
Packaging for harsh environments
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Materials
Non destructive evaluation
MOEMS packaging
Mechanical simulation
Thermal evaluation
RF and microwave packaging
Reliability
Microlithography issues unique to MEMS/MOEMS
Modeling and simulation of fabrication processes
Yield estimation
Manufacturing
PACS 85.42
Fault simulation and test pattern generation
Process monitoring
Model order reduction
Fault modeling
Integrated processes (micromachining
MEMS/MOEMS libraries and IP
actuators)
Multiphysics simulation
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- EDA Publishing Association. EDA Publishing Association, pp.429, 2009, Proceedings
- Accession number :
- edsair.dedup.wf.001..7cdd0e5e4e01466c59be70095dbfa313