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Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP 2009)

Authors :
Bourouina, Tarik
Courtois, B.
Ghodssi, R.
Karam, J.M.
Soma, A.
Yang, H.Y.
Electronique, Systèmes de communication et Microsystèmes (ESYCOM)
Conservatoire National des Arts et Métiers [CNAM] (CNAM)-Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris
Circuits Multi-Projets (CMP)
Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)
Dept. of Electrical and Computer Engineering
Memscap
MEMSCAP
Department of Mechanics
Politecnico di Torino = Polytechnic of Turin (Polito)
Center of Nanoscience and Nanotechnology
National Chung Hsing University (NCHU)
EDA Publishing Association
Conservatoire National des Arts et Métiers [CNAM] (CNAM)
HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-HESAM Université - Communauté d'universités et d'établissements Hautes écoles Sorbonne Arts et métiers université (HESAM)-Université Paris-Est Marne-la-Vallée (UPEM)-ESIEE Paris
Source :
EDA Publishing Association. EDA Publishing Association, pp.429, 2009, Proceedings
Publication Year :
2009
Publisher :
HAL CCSD, 2009.

Abstract

ISBN: 978-2-35500-009-6; This Symposium is a follow-up to the very successful issues held in 1999 and 2000 in Paris and in 2001, 2002 and 2003 in Mandelieu-La Napoule, in 2004 and 2005 in Montreux, Switzerland and in 2006 and in 2007 in Stresa, Italy and in 2008 in Nice, France. This series of Symposia is a unique single-meeting event expressly planned to bring together participants interested in manufacturing microstructures and participants interested in design tools to facilitate the conception of these microstructures. Again, a special emphasis will be put on the very crucial needs of MEMS/MOEMS in terms of packaging solutions. The goal of the Symposium is to provide a forum for in-depth investigations and interdisciplinary discussions involving design, modeling, testing, micromachining, microfabrication, integration and packaging of structures, devices, and systems. We hope you enjoy the technical presentations of 2 conferences - CAD, Design and Test / Microfabrication, Integration and Packaging -, of 2 joint invited talks, and of a special session on 3D Integration of MEMS.

Details

Language :
English
Database :
OpenAIRE
Journal :
EDA Publishing Association. EDA Publishing Association, pp.429, 2009, Proceedings
Accession number :
edsair.dedup.wf.001..7cdd0e5e4e01466c59be70095dbfa313