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Measurement Effects on Ø-Symmetric Shaped Patterns Generated by Circular Continuous Apertures

Authors :
Brégains, Julio
Ares Pena, F. J.
Moreno Piquero, E.
Source :
RUC. Repositorio da Universidade da Coruña, instname
Publication Year :
2003
Publisher :
Institute of Electrical and Electronics Engineers, 2003.

Abstract

[Abstract] Sidelobe-level and ripple behaviors of Ø-symmetric shaped patterns, generated by circular, real and complex, continuous Taylor distributions, is analyzed as a function of measurement distances. This paper reveals that real distributions suffer less-significant power pattern degradation than complex distributions at near-field distances.

Details

Language :
English
Database :
OpenAIRE
Journal :
RUC. Repositorio da Universidade da Coruña, instname
Accession number :
edsair.dedup.wf.001..8488165f211543b147f6b7f0219e5b28