Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al/sub 2/O/sub 3//Si surfaces

Authors :: Renault, O.
Marlier, R.
Gely, M.
De Salvo, B.
Baron, T.
Hansson, M.
Barrett, N.T.
Clot, Marielle
Laboratoire des technologies de la microélectronique (LTM)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Joseph Fourier - Grenoble 1 (UJF)-Centre National de la Recherche Scientifique (CNRS)
Université Joseph Fourier - Grenoble 1 (UJF)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)
Source :: Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2005, pp.87(16), October 163119-1-3, Applied Physics Letters, 2005, pp.87(16), October 163119-1-3
Publication Year :: 2005
Publisher :: HAL CCSD, 2005.
Abstract: International audience

Language :: English
ISSN :: 00036951
Database :: OpenAIRE
Journal :: Applied Physics Letters, Applied Physics Letters, American Institute of Physics, 2005, pp.87(16), October 163119-1-3, Applied Physics Letters, 2005, pp.87(16), October 163119-1-3
Accession number :: edsair.dedup.wf.001..8b3fafbb6852e8db61eabfddb663c9bb

Tools