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Series Resistance Effects on the Back-Gate Biased Operation of Junctionless Transistors (poster)

Details

Language :
English
Database :
OpenAIRE
Journal :
2019 Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 2019 Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), Apr 2019, Grenoble, France. Actes pp. 36-37, HAL
Accession number :
edsair.dedup.wf.001..a231951af9e0a5945adba54d9cb4b565