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BIST Solutions for Industrial Mixed-signal Circuits

Authors :
Mir, Salvador
Barragan, Manuel J.
Mammasse, M.
Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA)
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
STMicroelectronics [Crolles] (ST-CROLLES)
European Project: 172930120,PENTA,RECHADESTIMD,HADES(2017)
BEN TITO, Laurence
Hierarchy-Aware and secure embedded test infrastructure for Dependability and performance Enhancement of integrated Systems - HADES - - PENTA2017-04-01 - 0000-00-00 - 172930120 - VALID
Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA)
Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)
Source :
25th International, Testing Symposium (IOLTS 2019), Testing Symposium (IOLTS 2019), Jul 2019, Rhodes, Greece
Publication Year :
2019
Publisher :
HAL CCSD, 2019.

Abstract

International audience; This talk will describe BIST solutions that have been developed in the last years in the frame of joint development work between TIMA Laboratory and STMicroelectronics. These solutions that are today of industrial application are aimed at ADCs, PLLs and CMOS imagers. They all use fully or mostly digital test circuitry, making them highly portable across different technologies. We will also draw some perspectives on new joint development work for mixed-signal/RF circuits and systems.

Subjects

Subjects :
BIST
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
PACS 85.42
Hardware_INTEGRATEDCIRCUITS
Hardware_PERFORMANCEANDRELIABILITY
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
analog and mixed-signal test

Details

Language :
English
Database :
OpenAIRE
Journal :
25th International, Testing Symposium (IOLTS 2019), Testing Symposium (IOLTS 2019), Jul 2019, Rhodes, Greece
Accession number :
edsair.dedup.wf.001..c180d20214cf08da44a15a1a3c6bd4f9

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