Localization of 1/f noise sources in Si/SiGe:C HBTs

Authors :: Seif, Marcelino
Pascal, Fabien
Sagnes, Bruno
Elbeyrouthy, J.
Hoffmann, Alain
Haendler, S.
Chevalier, Pascal
Gloria, Daniel
Institut d’Electronique et des Systèmes (IES)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE)
Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
STMicroelectronics [Crolles] (ST-CROLLES)
STMicroelectronics
Source :: 8th International Conference on Unsolved Problems on Noise-UPON 2018, 8th International Conference on Unsolved Problems on Noise-UPON 2018, Jul 2018, Gdansk, Poland
Publication Year :: 2018
Publisher :: HAL CCSD, 2018.
Abstract: International audience

Subjects :: [SPI]Engineering Sciences [physics]
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
ComputingMilieux_MISCELLANEOUS

Language :: English
Database :: OpenAIRE
Journal :: 8th International Conference on Unsolved Problems on Noise-UPON 2018, 8th International Conference on Unsolved Problems on Noise-UPON 2018, Jul 2018, Gdansk, Poland
Accession number :: edsair.dedup.wf.001..c19d125c3d7e64566d581df7861dc1a4

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