Comparison of the use of SQUID an Hall effect sensors in NDE

Authors :: Bettaieb, L.
Kokabi, H.
Poloujadoff, M.
Sentz, A.
Krause, H. J
Coillot, Christophe
Laboratoire de Physique des Plasmas (LPP)
Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Observatoire de Paris
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-École polytechnique (X)-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-École polytechnique (X)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
Source :: Materials Evaluation, Materials Evaluation, American Society for Nondestructive Testing, 2010, 68 (5), pp.535-554, Materials Evaluation, 2010, 68 (5), pp.535-554
Publication Year :: 2010
Publisher :: HAL CCSD, 2010.
Abstract: International audience; ...

Subjects :: [PHYS.PHYS.PHYS-PLASM-PH]Physics [physics]/Physics [physics]/Plasma Physics [physics.plasm-ph]
[PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph]
ComputingMilieux_MISCELLANEOUS

Language :: English
ISSN :: 00255327
Database :: OpenAIRE
Journal :: Materials Evaluation, Materials Evaluation, American Society for Nondestructive Testing, 2010, 68 (5), pp.535-554, Materials Evaluation, 2010, 68 (5), pp.535-554
Accession number :: edsair.dedup.wf.001..d5b2091a8b16f4ffabdffe446fa36a86

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