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Determination of bulk mismatch values in transmission electron microscopy cross-sections of heterostructures by convergent-beam electron diffraction

Authors :
Balboni, R.
Stefano Frabboni
Armigliato, A.
Source :
ResearcherID

Subjects

Subjects :
STRAIN
SI1-XGEX
GROWTH
RELAXATION
CONVERGENT BEAM ELECTRON DIFFRACTION
SILICON

Details

Database :
OpenAIRE
Journal :
ResearcherID
Accession number :
edsair.dedup.wf.001..e7291807fc46294c366200ea32ab6dad

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Authors Abstract Subjects Details