Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources

MLA

Lázaro Guillén, Antoni, et al. Measurement of On-Wafer Transistor Noise Parameters without a Tuner Using Unrestricted Noise Sources. Jan. 2002. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..f1fe4dde7f0c33d990ee5078674d3d97&authtype=sso&custid=ns315887.

APA

Lázaro Guillén, A., Maya Sánchez, M. del C., & Pradell i Cara, L. (2002). Measurement of on-wafer transistor noise parameters without a tuner using unrestricted noise sources.

Chicago

Lázaro Guillén, Antoni, Mª del Carmen Maya Sánchez, and Lluís Pradell i Cara. 2002. “Measurement of On-Wafer Transistor Noise Parameters without a Tuner Using Unrestricted Noise Sources,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.dedup.wf.001..f1fe4dde7f0c33d990ee5078674d3d97&authtype=sso&custid=ns315887.