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Analysis of Inter-and Intra-Grain Defects in Electrically Characterized Poly-Si Nanowire TFTs by Multicomponent DF Imaging Based on NBD-2DI
- Source :
- Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
- Publication Year :
- 2017
- Publisher :
- The Japan Society of Applied Physics, 2017.
- Subjects :
- Materials science
business.industry
Nanowire
Optoelectronics
business
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials
- Accession number :
- edsair.doi...........00daf71e9b8ad1f0c05766a0a2880211