Dispersive white-light spectral interferometer for optical properties measurement of optical thin films

Authors :: 沈伟东 Weidong Shen
张淑娜 Shuna Zhang
罗震岳 Zhengyue Luo
刘旭 Xu Liu
夏梣 Cen Xia
尹伊 Yi Yin
Source :: Chinese Optics Letters. 8:99-102
Publication Year :: 2010
Publisher :: Shanghai Institute of Optics and Fine Mechanics, 2010.

Subjects :: Interferometry
Materials science
Optics
business.industry
White light
Electrical and Electronic Engineering
Thin film
business
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

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