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Electro-Optic Crosstalk in Parallel Silicon Photonic Mach-Zehnder Modulators
- Source :
- Journal of Lightwave Technology. 36:1713-1720
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2018.
-
Abstract
- Dense integration of electro-optic (EO) devices in photonic integrated circuits (PICs) is critical to achieve high-capacity, compact and low-cost transceiver modules, and fulfill the increasing bandwidth and/or bandwidth density demands for future computers, servers, data centers, and transport optical network systems. However, the EO crosstalk due to high integration density may degrade the signal transmission performance and eventually limit the possible density of integration. In this content, the study of the EO crosstalk of a PIC and its impact is crucial. In this paper, we systematically investigate and characterize the EO crosstalk between parallel silicon Mach–Zehnder modulators (MZMs). The performance penalty due to crosstalk is measured for different integration densities and data rates. For the MZM pair with a separation of 200 μm, there is a ∼−20 dB RF crosstalk in the frequency range >10 GHz, and up to 1.1 dB power penalty and 2.2 dB optical signal-to-noise ratio penalty are observed for 36-Gb/s on-off-keying signals. Our study can serve as a reference for integration density of large-scale silicon PICs for various applications.
- Subjects :
- Physics
Silicon photonics
Silicon
business.industry
Photonic integrated circuit
chemistry.chemical_element
02 engineering and technology
Mach–Zehnder interferometer
Atomic and Molecular Physics, and Optics
Crosstalk
020210 optoelectronics & photonics
chemistry
Optical signal to noise ratio
Server
0202 electrical engineering, electronic engineering, information engineering
Optoelectronics
Transceiver
business
Subjects
Details
- ISSN :
- 15582213 and 07338724
- Volume :
- 36
- Database :
- OpenAIRE
- Journal :
- Journal of Lightwave Technology
- Accession number :
- edsair.doi...........05741f8f13f7b6565244fab362bfa4c4
- Full Text :
- https://doi.org/10.1109/jlt.2018.2789582