In-situ imaging and control of intense soft and hard X-ray Fel beams by fluorescent detectors with submicron resolution

Authors :: S. S. Makarov
S. A. Pikuz
T. A. Pikuz
A. Ya. Faenov
A. N. Mitrofanov
T. Matsuoka
S. Matsuyama
K. Yamauchi
N. Ozaki
Y. Inubushi
M. Yabashi
K. Tono
Y. Sato
H. Yumoto
H. Ohashi
A. N. Grum-Grzhimailo
M. Nishikino
T. Kawachi
T. Ishikawa
R. Kodama
Publication Year :: 2019
Publisher :: Сборник тезисов конференции «Complex Systems of Charged Particles and their Interactions with Electromagnetic Radiation», 2019.

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