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Using a 2x‐thru standard to achieve accurate de‐embedding of measurements

Authors :
Sedig Agili
Stephen B. Smith
Jason J. Ellison
Source :
Microwave and Optical Technology Letters. 62:675-682
Publication Year :
2019
Publisher :
Wiley, 2019.

Subjects

Subjects :
Computer science
Broadband
Electronic engineering
Embedding
Electrical and Electronic Engineering
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Details

ISSN :
10982760 and 08952477
Volume :
62
Database :
OpenAIRE
Journal :
Microwave and Optical Technology Letters
Accession number :
edsair.doi...........07e3faee3bcb9691b7c4a56389338d41
Full Text :
https://doi.org/10.1002/mop.32098
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