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Signal-signal D-probe and unified launch pad designs

Authors :
Yuan Chen
Han Deng
Xiaoning Ye
James L. Drewniak
Jimmy Hsu
Richard Zai
Jun Fan
Bichen Chen
Source :
IEEE Electromagnetic Compatibility Magazine. 7:101-106
Publication Year :
2018
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2018.

Abstract

In this paper, two different micro probes (D-probe and GSSG probe) are studied. A specially designed PCB was used to compare the electrical performances of DUTs with de-embedded fixtures for the micro probes and 2.9 mm connectors. Smart Fixture De-embedding (SFD) was used to de-embed the S-parameters of the DUT from the test fixtures. The results showed consistent results of DUTs using both micro probes and 2.92 mm connectors up to nearly 40GHz.

Details

ISSN :
21622272 and 21622264
Volume :
7
Database :
OpenAIRE
Journal :
IEEE Electromagnetic Compatibility Magazine
Accession number :
edsair.doi...........08c9a5fd90de612ea24b33e8f3ed39d5
Full Text :
https://doi.org/10.1109/memc.2018.8479348