Experimental investigation of SiC 6.5kV JBS diodes safe operating area

MLA

Lukas Kranz, et al. “Experimental Investigation of SiC 6.5kV JBS Diodes Safe Operating Area.” 2017 29th International Symposium on Power Semiconductor Devices and IC’s (ISPSD), May 2017. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........0a0ef673e29c6ae25c7eb79e30c2dd52&authtype=sso&custid=ns315887.

APA

Lukas Kranz, Giovanni Alfieri, Charalampos Papadopoulos, Philippe Godignon, Victor Soler, Umamaheswara Vemulapati, Enea Bianda, A. Mihaila, Munaf Rahimo, & Lars Knoll. (2017). Experimental investigation of SiC 6.5kV JBS diodes safe operating area. 2017 29th International Symposium on Power Semiconductor Devices and IC’s (ISPSD).

Chicago

Lukas Kranz, Giovanni Alfieri, Charalampos Papadopoulos, Philippe Godignon, Victor Soler, Umamaheswara Vemulapati, Enea Bianda, A. Mihaila, Munaf Rahimo, and Lars Knoll. 2017. “Experimental Investigation of SiC 6.5kV JBS Diodes Safe Operating Area.” 2017 29th International Symposium on Power Semiconductor Devices and IC’s (ISPSD), May. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........0a0ef673e29c6ae25c7eb79e30c2dd52&authtype=sso&custid=ns315887.