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Electron injection and interfacial reactions at valve metal oxides
- Source :
- Thin Solid Films. 43:103-129
- Publication Year :
- 1977
- Publisher :
- Elsevier BV, 1977.
-
Abstract
- The normally blocking contact between a valve metal oxide, e.g. Ta 2 O 5 , and a semiconducting oxide, e.g. MnO 2 , can be transformed into an electron injecting contact as a consequence of ionic polarization at the contact interface. Electron injection follows a Poole-Frenkel characteristic. The time-dependent development of the injection current at the anodization field of the valve metal oxide is directly related to the ionic charge transport in the interface and provides a very sensitive means of studying ionic charge transport and interface reactions through their effect on the electronic injection current. In this paper the results of experiments using Ta 2 O 5 and Nb 2 O 5 as typical valve metal oxides and FeO x , MnO x , NiO x and other representative contact oxides are reviewed.
- Subjects :
- Materials science
Anodizing
Non-blocking I/O
Inorganic chemistry
Metals and Alloys
Oxide
Surfaces and Interfaces
Electron
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Ion
chemistry.chemical_compound
chemistry
Chemical engineering
Valve metal
Electron injection
Materials Chemistry
Current (fluid)
Subjects
Details
- ISSN :
- 00406090
- Volume :
- 43
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........0a11bca950dc60a6da64e6af192595ef