Simultaneous Measurement of Electric and Magnetic Fields With a Dual Probe for Efficient Near-Field Scanning

A near-field scanning is usually time-consuming to map the electromagnetic field along the surface of a device. In this communication, a dual probe is proposed with a U-shaped loop to sense radio frequency (RF) magnetic and electric fields simultaneously, so that the one-time scanning by the dual probe can replace the two-time scanning by single-detector probes. Different from the traditional near-field scanning by using a single-detector probe and spectrum analyzer, the proposed scanning can be achieved by the two-output probe and a two-port vector network analyzer connecting to the probe. The efficient near-field scanning measurements of the electric and magnetic field on a conductor-backed coplanar waveguide transmission line and an RF power divider by using the dual probe are in agreement with those by using two single-detector probes.